Topographic effect correction using CRS parameters

The Common Reflection Surface (CRS) is a stacking process that simulates a zero-offset section and provides useful parameters sections. It can be applied to the real non horizontal measurement surface and it is necessary to remove the topographic effect to obtain a more accurate section to be interpretated. This work presents a new technique to remove the topographic effect: continuation of the information to a chosen depth datum using the CRS parameter. A synthetic example is provided to illustrate the approach.